A BIST (built-in self-test) strategy for mixed-signal integrated circuits [Elektronische Ressource] / vorgelegt von Hongzhi, Li

A BIST (BUILT-IN SELF-TEST) STRATEGY FOR MIXED-SIGNAL INTEGRATED CIRCUITS Der Technischen Fakult t der Universit t Erlangen-N?rnberg zur Erlangung des akademischen Grades DOKTOR-INGENIEUR Vorgelegt von Hongzhi, Li Erlangen - 2004 Als Dissertation genehmigt von der Technischen Fakult t der Universit t Erlangen-Nrnberg ? Tag der Einreichung: 19.04.2004 Tag der Promotion: 29.10.2004 Dekan: Prof. rer. nat. Albrecht Winnacker Berichterstatter: Prof. Dr. -Ing. Dr. -Ing. habil. Robert Weigel Prof. Dr. -Ing. Richard Hagelauer II Acknowledgments I would like to take this opportunity to thank those who have made the recent three years of my life a memorable and unforgettable experience. First of all, I would like to thank my supervisor Prof. Dr. Robert Weigel of the Univer-sity of Erlangen-N rnberg, Germany. Thanks for the support, for the intelligent guid-ance, for the valuable comments when I need them most. Above of all, for the trust demonstrated in giving me the opportunity to pursue this interesting experience. A few words cannot express the extent to which I am indebted to the positive influence from him. Then, I would like to thank Prof. Dr. Andreas Springer of the University of Linz, Aus-tria, who was my supervisor of my master thesis in 2000 and gives me much support even from a distance during my Ph. D. research.