Wideband impedance spectrum analyzer with arbitrary fine frequency resolution for in situ sensor applications [Elektronische Ressource] / von Thomas Schneider

Wideband impedance spectrum analyzer with arbitrary fine frequency resolution for in situ sensor applications Dissertation zur Erlangung des akademischen Grades Doktoringenieur (Dr.-Ing.) von Dipl.-Ing. Thomas Schneider geboren am 31. Dezember 1977 in Blankenburg genehmigt durch die Fakultät für Elektrotechnik und Informationstechnik der Otto-von-Guericke-Universität Magdeburg Gutachter: Prof. Dr. rer. nat. habil. Peter Hauptmann Prof. Dr.-Ing. habil. Helmut Beikirch Eingereicht am 02. Juli 2008 Promotionskolloquium am 05. Februar 2009   Preface The present thesis results from my work as research assistant at the Sensor and Measurement Tech-nology group in the Institute of Micro and Sensor Systems at the Otto-von-Guericke-University Magdeburg. First, I would like to express my special gratitude to my doctoral advisor Prof. Dr. Peter R. Haupt-mann for providing me the opportunity to carry out my research work on an interesting and diversified topic, and for all guidance and support. I am also very grateful to all my colleagues at the Institute of Micro– and Sensor Systems for their kind assistance. Special thanks go to Steffen Doerner for the technical advice that he has given me on the development of the analyzer electronics and his good teamwork throughout this time. I am also grateful to Dr.