Thermography of semiconductor lasers [Elektronische Ressource] : from thermal emission of semiconductors towards a novel analytical tool for optoelectronic devices / von Mathias Ziegler

Thermography of Semiconductor LasersFrom Thermal Emission of Semiconductors towards a NovelAnalytical Tool for Optoelectronic DevicesDISSERTATIONzur Erlangung des akademischen Gradesdoctor rerum naturalium(Dr. rer. nat.)im Fach Physikeingereicht an derMathematisch-Naturwissenschaftlichen Fakultät IHumboldt-Universität zu BerlinvonHerr Dipl.-Phys. Mathias Zieglergeboren am 16.11.1977 in BerlinPräsident der Humboldt-Universität zu Berlin:Prof. Dr. Dr. h.c. Christoph MarkschiesDekan der Mathematisch-Naturwissenschaftlichen Fakultät I:Prof. Dr. Lutz-Helmut SchönGutachter:1. Prof. Dr. Thomas Elsässer2. Prof. Dr. W. Ted Masselink3. Prof. Dr. Joachim Wagnereingereicht am: 24.02.2009Tag der mündlichen Prüfung: 19.06.2009iiAbstractSemiconductor lasers are unequaled efficient light sources, reaching efficien-cies of more than 70%. Nevertheless, thermal limits govern their reliableapplication, in particular in the field of high power densities. The analysisof thermal properties and degradation processes in such devices contributesessentially to the understanding of these limits. This work exploits thermog-raphy as an innovative analytical technique for such purpose. Starting frommeasurements of the thermal emission from semiconductor laser structures,thethermographicmethodologyisdiscussed, takingintoaccountthephysicalproperties of the semiconductor materials.