Reconstruction of surface morphology from coherent scattering of white synchroton radiation in hard x-ray regime [Elektronische Ressource] / vorgelegt von Tushar Sant

Reconstruction of surface morphology from UDGLDWLRQZ KLWH?V\QFKURWURQ HULQJRI? FRKHUHQWVFDWW in hard x-ray regime Dissertation zur Erlangung des Grades eines Doktors der Naturwissenschlaften vorgelegt von M.Sc. Tushar Sant geb. am 30.05.1976 in Pune (India) eingereicht beim Fachberich-7, Physik der Universität Siegen Siegen, 2009 Abstract Abstract The present third generation synchrotron sources provide intense x-ray radiation in hard x-ray regime. The sufficient coherent flux provided by these sources makes it possible to perform coherent x-ray scattering experiments. In 90´s several attempts have been made in performing speckle experiments with x-ray radiation at various surfaces which can provide sub-nm spatial resolution. However, the method is not well established as a routine characterization technique. Several details of the experimental technique and data analysis are not solved. The speckle experiments performed earlier used monochromatic coherent x-ray radiation. It has been shown that the results of such kind of measurements sensitively depend on various parameters of the experiment. Energy Dispersive Reflectometry (EDR) beamline at BESSY II -rays in the useful energy range of . The availability of the measured speckle data at different energies provides redundant information and is expected to be useful in making the reconstruction of surface profile simpler.