Nanotribological surface characterization by frequency modulated torsional resonance mode AFM [Elektronische Ressource] / Ayhan Yurtsever

Nanotribological surface characterization by frequency modulated torsional resonance mode AFM Dissertation der Fakultät für Geowissenschaften der Ludwig-Maximilians-Universität München Ayhan Yurtsever 27. March 2008 Disputation: 04. July 2008 Referees: PD Dr. Robert W. Stark Prof. Dr. Wolfgang W. Schmahl 2 Abstract The aim of this work is to develop an experimental method to measure in-plane surface properties on the nanometer scale by torsional resonance mode atomic force microscopy and to understand the underlying system dynamics. The invention of the atomic force microscope (AFM) and the advances in development of new AFM based techniques have significantly enhanced the capability to probe surface properties with nanometer resolution. However, most of these techniques are based on a flexural oscillation of the force sensing cantilever which are sensitive to forces perpendicular to the surface. Therefore, there is a need for highly sensitive measurement methods for the characterization of in-plane properties. To this end, scanning shear force measurements with an AFM provide access to surface properties such as friction, shear stiffness, and other tribological surface properties with nanometer resolution.