Growth and characterization of thin Al_1tn2O_1tn3 and Ga_1tn2O_1tn3 films on single-crystalline Ni, Co, and CoGa substrates [Elektronische Ressource] / vorgelegt von Arno Wehner

~\bOgM;YXQxY]MbZ~\;J !"#$%'&)(%*,+)-.KkZ/T>Y*KkZ9T${+O`J\???YXlJY]O-10YXm??PY]O%(%243"56%879(!,:;=<83,(%(%%>@?ACBDEB>cY]O>|6YXUoJO`UopqlRs|6YXUoJYCRs}>JUz~Y]O`WgUzZk{E9/456F>G>3 H3LWgWuYXQoc\bOgvIJ6KLNM"LNOPKQSR9TVUXW,WYOZHK[ZPU]\J?^KbLW>?\;JJLO^_O`QaKbJMLJMdcYXW6T\beZf\bOgM;OfKbcYXWhcY]O*b?;?;-ijKkZflYXmnKkZfUoWgpqlRsrKkZfLOut>UoWgWuYXJWgpql,K=vwZfQxUopflYXJ$y,K=eSLQzZk{YXcO`LpfeZ6m$UzZNcY]OYXJYXlm$UxMLJMdcY]OijKkZflYXmnKkZfUoWgpqlRsrKkZfLOut>UxWgWuYXJRLJMWgpql,K=vwZfQoUopqlYXJy,K=eSLQzZk{LJcQoUopqlYXJKkZ8cY]O6|6YXUoJO`UopqlRs|6YXUoJYCRs}>JUz~Y]O`WgUzZk{?KkZhT${LWgWuYXQoc\bOgvcY]O8mY]vOb{Y]OgYXJZ-;?*b?;?O`\bvO`\bvT>OT>OQaKbLWSpqlUxY]Og?KbLmYXJK=M{YyOfKbJpqlLv*\bOgOgY]vY]OgYXJZ`:!??',6g?8e?//0//////////0//////////0///` l`:?7 !#"%$&('!)*+&(',$ -.////0//////////0//////////0///acb78/h?h???dR986?&(Z?$ ??8?&(8Z?////0//////////0///?1`?4?A?@~??vuW>A@x?@RP??vJ:@R?|}J:@O+JL{pP 21435$ -7689:&(',$ -?721R!///0//////////0//////////0///`4hNe,86?&(Z?$ -%hN-78Z??%?$ \?\UdR986?&(Z?