Controlled resolution reconstruction of one-dimensional permittivity profiles [Elektronische Ressource] / von Jaleel Akhtar

Controlled Resolution Reconstruction ofOne-Dimensional Permittivity ProfilesDissertationzur Erlangung des akademischen GradesDoktoringenieur(Dr.-Ing.)von M.Eng. Md. Jaleel Akhtargeb. am 26 M¨arz 1971 in Gaya, Indiengenehmigt durchdie Fakulta¨t fur¨ Elektrotechnik und Informationstechnikder Otto-von-Guericke-Universit¨at MagdeburgGutachter:Prof. Dr.-Ing. A. S. OmarProf. Dr.-Ing. habil. Bernd MichaelisProf. Dr. V. F. HannaPromotionskolloquium am: 03. September 2003AcknowledgementsSeldomisanythingaccomplishedwithouttheassistanceorencouragementofothers.Thisthesiswouldalsonothavebeeninitspresentformwithoutthesupportofmanypeoplewho,inonewayorother,providedhelptome. Itismyhumbledutytothankall those people at this stage.First and foremost, I would like to thank my supervisor, Prof. Dr.-Ing. A. S.Omar, for his kind guidance throughout this research work. Apart from being anexcellent supervisor, he has also been my mentor and a great source of inspiration.His positive attitude towards younger researchers, and his unquenchable curiosityand love for the subject are probably some of the things, which I really admiredin him. I am also grateful to Prof. Dr.-Ing. habil. Bernd Michaelis, University ofMagdeburg, and Prof. Dr. V. F. Hanna, University of Pierre et Marie Curie, Paris,for kindly agreeing to be referees for this thesis in spite of their hectic schedules.