Characterization of the imaging performance of the simultaneously counting and integrating X-ray detector CIX [Elektronische Ressource] / vorgelegt von Johannes Fink

Characterization of the ImagingPerformance of the SimultaneouslyCounting and Integrating X-ray DetectorCIXDissertationzurErlangung des Doktorgrades (Dr. rer. nat.)derMathematisch-Naturwissenschaftlichen Fakult atderRheinischen Friedrich-Wilhelms-Universit at Bonnvorgelegt vonJohannes FinkausNeuwiedBonn 2009Angefertigt mit Genehmigung der Mathematisch-Naturwissenschaftlichen Fakult at derRheinischen Friedrich-Wilhelms-Universit at Bonn1. Referent: Prof. Dr. N. Wermes2. Referent: Prof. Dr. H. Schmieden.Tag der Promotion: 23.10.2009Erscheinungsjahr: 2010AbstractThe CIX detector is a direct converting hybrid pixel detector designed for medical X-rayimaging applications. Its de ning feature is the simultaneous operation of a photon counteras well as an integrator in every pixel cell. This novel approach o ers a dynamic range ofmore than ve orders of magnitude, as well as the ability to directly obtain the averagephoton energy from the measured data. Several CIX 0.2 ASICs have been successfullyconnected to CdTe, CdZnTe and Si sensors. These detector modules were tested withrespect to the imaging performance of the simultaneously counting and integrating conceptunder X-ray irradiation. Apart from a characterization of the intrinsic bene ts of theCIX concept, the sensor performance was also investigated. Here, the two parallel signalprocessing concepts o er valuable insights into material related e ects like polarization andtemporal response.