Advanced mirror concepts for high-precision metrology [Elektronische Ressource] / Frank Brückner. Gutachter: Andreas Tünnermann ; Ulf Peschel ; Chang-Hasnain

Advanced mirror concepts forhigh-precision metrologyDISSERTATIONzur Erlangung des akademischen Gradesdoctor rerum naturalium{ Dr. rer. nat. {vorgelegt dem Rat der Physikalisch-Astronomischen Fakult atder Friedrich-Schiller-Universit at Jenavon Diplom-Physiker Frank Bruc knergeboren am 21.08.1981 in DresdenGutachter1. Prof. Dr. Andreas Tunnermann, Friedrich-Schiller-Universitat Jena2. Prof. Dr. UlfPeschel, Friedrich-Alexander-UniversitatErlangen-Nurn berg3. Prof. Dr. Connie Chang-Hasnain, University of California, BerkeleyTag der Disputation: 08.02.2011ContentsTable of contents I1 Introduction 12 The current state of knowledge 42.1 Thermal noise in high-precision metrology . . . . . . . . . . . . . . . . . . 42.2 Brownian thermal noise due to dielectric optical coatings . . . . . . . . . . 72.3 Guided-mode resonant waveguide gratings (RWGs) . . . . . . . . . . . . . 122.3.1 Description of RWGs in a ray picture . . . . . . . . . . . . . . . . . 142.3.2 of RWGs by the modal method . . . . . . . . . . . . . 202.3.3 Rigorous numerical treatment of RWGs . . . . . . . . . . . . . . . . 263 RWGs for mirror applications 293.1 Tantala based RWGs for 1064 nm laser light . . . . . . . . . . . . . . . . . 303.1.1 Grating design considerations . . . . . . . . . . . . . . . . . . . . . 303.1.2 Fabrication process . . . . . . . . . . . . . . . . . . . . . . . . . . . 313.1.3 Experimental characterization . . . . . . . . . . . . . . . . . . . . . 323.1.