A grating interferometer for materials science imaging at a second-generation synchrotron radiation source [Elektronische Ressource] / vorgelegt von Julia Herzen

A grating interferometer for materials scienceimaging at a second-generation synchrotronradiation sourceDissertationzur Erlangung des Doktorgradesdes Department Physikder Universit¨at Hamburgvorgelegt vonJulia Herzenaus SwerdlowskHamburg2010Gutachter der Dissertation:Prof. Dr. A. Schreyer,GKSS Forschungszentrum Geesthacht und Universita¨t HamburgProf. Dr. F. Pfeiffer,Technische Universita¨t Mu¨nchenGutachter der Disputation:Prof. Dr. A. SchreyerGKSS Forschungszentrum Geesthacht und Universita¨t HamburgProf. Dr. M. Mu¨llerGKSS Forschungszentrum Geesthacht undChristian-Albrecht-Universita¨t zu KielDatum der Disputation:27. August 2010Vorsitzender des Pru¨fungsausschusses:Dr. K. PetermannVorsitzender des Promotionsausschusses:Prof. Dr. J. BartelsLeiterin des Departments Physik:Prof. Dr. D. PfannkucheDekan der MIN-Fakult¨at:Prof. Dr. H. GraenerA grating interferometer for materials science imagingat a second-generation synchrotron radiation sourceJulia HerzenAbstractX-ray phase-contrast radiography and tomography enables to increase contrast for weaklyabsorbing materials. Recently, x-ray grating interferometers were developed which extendthe possibility of phase-contrast imaging from highly brilliant radiation sources like third-generation synchrotron tonon-coherent conventional x-ray tubesources.