![Characterization of surface defects produced with focused ion beams and exploration of applications for controlled growth of nanostructures [Elektronische Ressource] / vorgelegt von Farhad Ghaleh](https://img.uscri.be/pth/567b206807c30f61d2c2151c0cc1c4f14c1bea1e)
Documents
Savoirs
Characterization of surface defects produced with focused ion beams and exploration of applications for controlled growth of nanostructures [Elektronische Ressource] / vorgelegt von Farhad Ghaleh
Auteur
Farhad Ghaleh
Œuvres
(
1
)
Ajouté à mes notifications
Vous serez informé des prochaines publications.